IP to the Pin is a software technology that will significantly influence automated test in the coming one to three years, according to National Instruments’ 2011 Automated Test Outlook, a view of key technologies and methodologies impacting the test and measurement industry. Sharing FPGA IP between design and test will dramatically shorten design verification/validation and improve production test time and fault coverage, the report says.
In addition to software, the outlook includes trends in business strategy, architecture and computing.
