By now, it is a tired truism to say that the consumer electronics industry has consistently delivered on its promise to provide products that are smaller, faster, and more feature-rich at an ever cheaper price. The main driver for these trends has been the increasing integration of more functions on a single chip. In spite of its greater performance, the PC of today has far … [Read more...]
Characterizing a package on a populated printed circuit board
This column has emphasized methods of analyzing packages in the JEDEC-standard test environment. A thermal metric that lends itself to analyses of system applications is the junction-to-board thermal characterization parameter, JB. If one knows the board temperature (TB), then the junction temperature (TJ) can be determined by a simple application of the following formula: TJ … [Read more...]
Don't underestimate radiation in electronic cooling
don't underestimate radiation in electronics cooling Bruce M. Guenin, Ph.D., Associate Editor, Amkor Technology, Inc. It is easy to underestimate the role of thermal radiation as a significant contributor to electronics cooling in environments without forced air flow. By its very nature it is invisible. The proper treatment of it can be intimidating due to the complicated … [Read more...]
Component thermal characterization
For decades, the worldwide electronics industry has produced a stream of products that continue to amaze us with their capabilities, their compactness, and their low price. This track record is due, in part, to an intricate set of interrelationships between a large number of hardware and software vendors who balance cooperative and competitive market strategies. Key elements in … [Read more...]
Determining the junction temperature in a semiconductor package, part IV – localized heat generation on the die
In the standard thermal test environment, thermal test chips are designed to dissipate the applied power uniformly over most of the die surface. However, in many situations of practical interest, the power is dissipated over a localized area of the die. This column provides calculation methods to deal with the latter situation. Figure 1 illustrates the situation of interest … [Read more...]
- « Previous Page
- 1
- …
- 3
- 4
- 5
- 6
- 7
- Next Page »
