Microsanj’s turnkey solution has 100 nsec temporal, submicron spatial and 0.08C temperature resolutions. The system supports 1024x1024 full field imaging with advanced acquisition/analysis software. In addition to participating with a live demonstration on the exhibition floor at SEMITHERM 27, Microsanj is hosting a workshop at 3 p.m. Wednesday in partnership with Prof. Ali … [Read more...]
Numerical Simulation of Complex Submicron Devices
Introduction Significant increases in temperature are believed to contribute to losses in reliability and performance, and can present serious complications to thermal management. The net thermal effect depends on a combination of factors related to the feature size, power densities, and material properties. In semiconductor devices, higher heat flux densities can result from … [Read more...]
