Linear Technology Corporation’s new LTC2991 is an 8-channel I²C temperature, voltage and current monitor for 3V and 5V systems. The LTC2991 is a highly integrated monitoring solution that incorporates a 14-bit ADC, 10ppm/°C voltage reference and I²C digital interface to provide submillivolt voltage resolution and 1% current measurement, as well as ±0.7°C remote accuracy and … [Read more...]
Numerical Simulation of Complex Submicron Devices
Introduction Significant increases in temperature are believed to contribute to losses in reliability and performance, and can present serious complications to thermal management. The net thermal effect depends on a combination of factors related to the feature size, power densities, and material properties. In semiconductor devices, higher heat flux densities can result from … [Read more...]
E missivity in Practical Temperature Measurements
When making temperature measurements with infrared cameras and point detectors, we are always facing the question of the emissivity of our sample. In practice we would like to have a single number set in the IR device. To approach the question, let's first recall some fundamental definitions. Planck's radiation law gives the energy density emitted by a blackbody as a function … [Read more...]
Heat transfer measurements in electronics cooling applications
Introduction Increased performance in electronic systems along with higher packaging densities have made temperature a critical parameter. Measurements of temperature, velocity and heat transfer in electronic systems are challenging due to complex materials, configurations, and non-isothermal flows. Earlier articles have considered different aspects of thermal measurements. … [Read more...]
Electrical temperature measurement using semiconductors
Introduction Semiconductor junctions offer many useful properties including inherentcharacteristics which are well suited to temperature measurement. Within theelectronics cooling arena, these properties form the basis for "theelectrical method of junction temperature measurement" and are used formeasurement of junction temperatures within operating semiconductor devices. They … [Read more...]
